Conference
Characterization and modeling of high-frequency noise in MOSFETs for RF IC design
Authors
Chen C-H; Asgaran S; Li F; Deen MJ
Volume
5470
Pagination
pp. 49-60
Publisher
SPIE, the international society for optics and photonics
Publication Date
May 25, 2004
DOI
10.1117/12.547190
Name of conference
Noise in Devices and Circuits II
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X