Conference
An analytical method to determine MOSFET’s high frequency noise parameters from 50-Ω noise figure measurements
Authors
Asgaran S; Deen MJ; Chen C-H
Volume
2006
Pagination
pp. 4 pp.-304
DOI
10.1109/RFIC.2006.1651151
Experts has a new look! Let us know what you think of the updates.
Provide feedback