Conference
High-frequency noise modelling and the scaling of the noise parameters of polysilicon emitter bipolar junction transistors
Abstract
This paper presents detailed results from modelling the four noise parameters: minimum noise figure (NF MIN ), noise resistance (R N ), optimal source resistance (R S,OPT ), and reactance (X S,OPT ) as functions of frequency and collector-biasing current. Compared to previous BJT (bipolar junction transistor) high-frequency noise models, we include the emitter resistance, which results in an increased input device impedance, and a degeneration …
Authors
Deen MJ
Volume
74
Pagination
pp. 195-199
Publisher
Canadian Science Publishing
Publication Date
December 1, 1996
DOI
10.1139/p96-858
Conference proceedings
Canadian Journal of Physics
Issue
12
ISSN
0008-4204