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High-frequency noise modelling and the scaling of...
Conference

High-frequency noise modelling and the scaling of the noise parameters of polysilicon emitter bipolar junction transistors

Abstract

This paper presents detailed results from modelling the four noise parameters: minimum noise figure (NF MIN ), noise resistance (R N ), optimal source resistance (R S,OPT ), and reactance (X S,OPT ) as functions of frequency and collector-biasing current. Compared to previous BJT (bipolar junction transistor) high-frequency noise models, we include the emitter resistance, which results in an increased input device impedance, and a degeneration …

Authors

Deen MJ

Volume

74

Pagination

pp. 195-199

Publisher

Canadian Science Publishing

Publication Date

December 1, 1996

DOI

10.1139/p96-858

Conference proceedings

Canadian Journal of Physics

Issue

12

ISSN

0008-4204