Conference
Low frequency noise in npn and pnp polysilicon emitter bipolar junction transistors
Abstract
Low frequency noise characteristics of a high voltage, high performance complementary polysilicon emitter (PE) bipolar transistors are described. The influence of the base biasing resistance, emitter geometry, and temperature on the noise spectra are discussed. The npn transistors studied exhibited 1/f and shot noise, but the pnp transistors, are characterized by significant generation-recombination noise contributions to the total noise. For …
Authors
Deen MJ
Volume
466
Pagination
pp. 105-122
Publisher
AIP Publishing
Publication Date
April 2, 1999
DOI
10.1063/1.58295
Conference proceedings
AIP Conference Proceedings
Issue
1
ISSN
0094-243X