Conference
Comparison of low-frequency noise in III-V and Si/SiGe HBTs
Authors
Pascal F; Guenard-Jarrix S; Delseny C; Penarier A; Chay C; Deen MJ
Volume
5113
Pagination
pp. 133-146
Publisher
SPIE, the international society for optics and photonics
Publication Date
May 12, 2003
DOI
10.1117/12.488966
Name of conference
Noise in Devices and Circuits
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X