Conference
An analytical method to determine MOSFET's high frequency noise parameters from 50-Omega noise figure measurements
Authors
Asgaran S; Deen MJ; Chen C-H
Editors
Ngo D
Series
IEEE Radio Frequency Integrated Circuits Symposium
Pagination
pp. 341-+
Publisher
IEEE
Publication Date
January 1, 2006
ISBN-10
0-7803-9573-5
Name of conference
IEEE Radio Frequency Integrated Circuits Symposium (RFIC)
Conference place
San Francisco, CA
Conference start date
June 11, 2006
Conference end date
June 13, 2006
Conference proceedings
2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS
ISSN
1529-2517