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RF noise models of MOSFETs - A review
Conference

RF noise models of MOSFETs - A review

Authors

Asgaran S; Deen MJ

Editors

Laudon M; Romanowicz B

Pagination

pp. 96-101

Publisher

NANO SCIENCE & TECHNOLOGY INST

Publication Date

January 1, 2004

ISBN-10

0-9728422-8-4

Name of conference

Nanotechnology Conference and Trade Show (Nanotech 2004)

Conference place

MA, Boston

Conference start date

March 7, 2004

Conference end date

March 11, 2004

Conference proceedings

NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS

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