Conference
THE ROLE OF POSITRON-ANNIHILATION SPECTROSCOPY IN THE STUDY OF DEFECTS IN CRYSTALLINE SILICON
Authors
MASCHER P
Editors
Bickert C; Bouchard M; Davies G; Ghali E; Jiran E
Pagination
pp. 915-924
Publisher
CANADIAN INST MINING, METALLURGY AND PETROLEUM
Publication Date
January 1, 1993
ISBN-10
0-919086-42-X
Name of conference
International Symposium on Light Metals Processing and Applications
Conference place
QUEBEC CITY, CANADA
Conference start date
August 29, 1993
Conference end date
September 1, 1993
Conference proceedings
LIGHT METALS PROCESSING AND APPLICATIONS