Investigation of the defect structure in Cd1−xZnxTe by positron lifetime spectroscopy

Positron lifetime spectroscopy has been employed to explore grown-in defects in Cd1−xZnxTe (CZT) as a function of increasing Zn content. We find that with the increase of Zn content, both the average positron lifetime τAvg, and the lifetime in the bulk τBulk, change smoothly from values typical for CdTe to those for ZnTe. In all samples, a defect-related lifetime component, τD could be resolved with values decreasing from 347ps in CdTe to 333ps …