X-ray spectroscopy studies of luminescent Si-based...

X-ray spectroscopy studies of luminescent Si-based materials

Abstract

X-ray based spectroscopies have been used to study nanocluster formation and luminescence in silicon oxynitride-based materials. For a luminescent Ce-doped silicon oxide details of the local chemical environment of the Ce atoms has been obtained.

Authors

Roschuk T; Wilson PRJ; Li J; Wojcik J; Mascher P

Pagination

pp. 288-290

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

January 1, 2008

DOI

10.1109/group4.2008.4638175

Name of conference

2008 5th IEEE International Conference on Group IV Photonics

Associated Experts

Peter Mascher

Professor, Faculty of Engineering

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Labels

Fields of Research (FoR)

40 Engineering 4016 Materials Engineering 34 Chemical Sciences

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