Conference
Defect Characterization of II-VI Compound Semiconductors Using Positron Lifetime Spectroscopy
Authors
Tessaro G; Mascher P
Volume
258-263
Pagination
pp. 1335-1340
Publisher
Trans Tech Publications
Publication Date
December 11, 1997
DOI
10.4028/www.scientific.net/msf.258-263.1335
Conference proceedings
Materials Science Forum
ISSN
0255-5476