Journal article
Optical characterization of epitaxial single crystal CdTe thin films on Al2O3 (0001) substrates
Abstract
The optoelectronic properties of single crystal CdTe thin films were investigated by photoluminescence spectroscopy, photoreflectance spectroscopy and variable angle spectroscopic ellipsometry. The room temperature bandgap was measured to be 1.51eV and was consistent between spectroscopic measurements and previously reported values. Breadth of bandgap emission was consistent with high quality material. Low temperature photoluminescence spectra …
Authors
Jovanovic SM; Devenyi GA; Jarvis VM; Meinander K; Haapamaki CM; Kuyanov P; Gerber M; LaPierre RR; Preston JS
Journal
Thin Solid Films, Vol. 570, , pp. 155–158
Publisher
Elsevier
Publication Date
11 2014
DOI
10.1016/j.tsf.2014.09.027
ISSN
0040-6090