Defect characterization of CdTe thin films using a slow positron beam

Abstract Cadmium Telluride (CdTe) is the most well established II–VI compound largely due to its use as a photonic material. Existing applications, as well as those under consideration, are demanding increasingly stringent control of the material properties. The deposition of high quality thin films is of the utmost importance to such applications. In this regard, we present a report detailing the role of lattice mismatch in determining the …