Conference
Local characterization of HTS thin films by laser scanning microscopy
Abstract
A high-resolution spatially resolved study of electrical inhomogeneties in high-Tc thin films by Laser Scanning Microscopy has been carried out. A laser beam was focused onto a submicrometer spot on the surface of a thin film microbridge that induced an increase in its local temperature. Bolometric or thermo-electric effects in the heated region resulted in a voltage change, δV, across the sample that has been measured as a function of the beam …
Authors
Korolev KA; Shadrin PM; Preston JS; Hughes RA; Nam JK; Pavlovskii VV
Volume
341
Pagination
pp. 1435-1438
Publisher
Elsevier
Publication Date
11 2000
DOI
10.1016/s0921-4534(00)00976-x
Conference proceedings
Physica C: Superconductivity and its Applications
ISSN
0921-4534