Journal article
Ultrafast Method for the Analysis of Fluorescence Lifetime Imaging Microscopy Data Based on the Laguerre Expansion Technique
Abstract
We report a new deconvolution method for fluorescence lifetime imaging microscopy (FLIM) based on the Laguerre expansion technique. The performance of this method was tested on synthetic and real FLIM images. The following interesting properties of this technique were demonstrated. 1) The fluorescence intensity decay can be estimated simultaneously for all pixels, without a priori assumption of the decay functional form. 2) The computation …
Authors
Jo JA; Fang Q; Marcu L
Journal
IEEE Journal of Quantum Electronics, Vol. 11, No. 5, pp. 835–845
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
2005
DOI
10.1109/jstqe.2005.857685
ISSN
0018-9197