Conference
Application of remote instrumentation to manufacturing
Authors
Szabados B; Hodaie P; Lu J; Ahluwalia K
Series
IEEE Instrumentation and Measurement Technology Conference
Pagination
pp. 1370-1375
Publisher
IEEE
Publication Date
2003
ISBN-10
0-7803-7705-2
Name of conference
20th IEEE Instrumentation and Measurement Technology Conference
Conference place
CO, VAIL
Conference start date
May 20, 2003
Conference end date
May 22, 2003
Conference proceedings
IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
ISSN
2642-2069