Thickness Alteration of Grain-Boundary Amorphous Films during Creep of a Multiphase Silicon Nitride Ceramic Academic Article uri icon

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authors

  • Jin, Qiang
  • Wilkinson, David S
  • Weatherly, George C
  • Luecke, William E
  • Wiederhorn, Sheldon M

publication date

  • June 1, 2001