High‐Resolution Electron Microscopy Investigation of Viscous Flow Creep in a High‐Purity Silicon Nitride Journal Articles uri icon

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abstract

  • The redistribution of intergranular amorphous films during creep deformation of Si3N4 has been studied by high‐resolution transmission electron microscopy. The film thickness distribution of a high‐purity Si3N4 material before and after creep was measured. A narrow range of film widths in the uncrept material and a bimodal distribution after creep were observed. These observations provided convincing evidence of the occurrence of viscous flow of intergranular amorphous films during creep deformation of Si3N4. Moreover, the creep response predicted by a viscous flow model was in good agreement with experimental data.

publication date

  • June 1999