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Microstructural characterization of a...
Journal article

Microstructural characterization of a microwave-sintered silicon nitride based ceramic

Abstract

The microstructure of a microwave-densified silicon nitride based ceramic has been assessed in the as-sintered, post-sinter hot-isostatically pressed (HIPed) and annealed conditions. The grain size of the as-sintered material, which is a low substitution β′-Sialon, was significantly finer than observed in conventionally processed materials of similar composition. The as-sintered ceramic exhibits a reverse porosity gradient (with the highest …

Authors

Plucknett KP; Wilkinson DS

Journal

Journal of Materials Research, Vol. 10, No. 6, pp. 1387–1396

Publisher

Springer Nature

Publication Date

June 1995

DOI

10.1557/jmr.1995.1387

ISSN

0884-2914