SURFACE STUDIES BY CORE-EXCITATION REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPY Conferences

abstract

• Inelastic electron scattering in a reflection geometry is a useful alternative to synchrotron radiation X-ray absorption spectroscopy for inner-shell excitation studies of surfaces. This article reviews the current capabilities of reflection electron energy loss spectroscopy for core-excitation studies of the electronic and geometric structure of surfaces. Issues discussed include: momentum transfer dependence, comparison to X-ray techniques, orientational sensitivity, spatial and energy resolution, and technological applications. Examples of applications to clean surfaces, atomic and molecular adsorbates, and thin films are given.

authors

• Hitchcock, Adam Percival
• TYLISZCZAK, T

status

• published 

publication date

• February 1995

has subject area

• 0206 Quantum Physics (FoR)
• 0306 Physical Chemistry (incl. Structural) (FoR)
• Chemical Physics (Science Metrix)

published in

• Surface Review and Letters  Journal

presented at event

• 11th International Summer Institute in Surface Science (ISISS-94)  Conference

keywords

• CHEMISORBED MOLECULES
• CRYSTAL-SURFACES
• Chemistry
• Chemistry, Physical
• DIPOLE APPROXIMATION
• HIGH-RESOLUTION
• K-EDGE
• LOSS FINE-STRUCTURE
• METAL-SURFACES
• MOLECULAR-BEAM EPITAXY
• Physical Sciences
• Physics
• Physics, Condensed Matter
• SEELFS TECHNIQUE
• Science & Technology
• X-RAY-ABSORPTION

Digital Object Identifier (DOI)

• 10.1142/s0218625x95000054

start page

• 43

end page

• 61

volume

• 02

issue

• 01