Si K-edge and Ge K-edge X-ray absorption spectroscopy of the SiGe interface in [(Si)m(Ge)n]p atomic layer superlattices Academic Article uri icon

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authors

  • Hitchcock, Adam Percival
  • Tyliszczak, T
  • Aebi, P
  • Xiong, JZ
  • Sham, TK
  • Baines, KM
  • Mueller, KA
  • Feng, XH
  • Chen, JM
  • Yang, BX
  • Lu, ZH
  • Baribeau, J-M
  • Jackman, TE

publication date

  • July 1993