Conference
SOFT X-RAY MICROSCOPY OF SOFT MATTER — HARD INFORMATION FROM TWO SOFTS
Abstract
Scanning transmission X-ray microscopy (STXM) and X-ray photoelectron emission microscopy (X-PEEM) provide quantitative chemical analysis at a spatial resolution well below 100 nm. Soft X-ray absorption or near edge X-ray absorption (NEXAFS) contrast provides sensitive differentiation of species which have similar elemental composition but are chemically distinct. Due to the ability of soft X-rays at wavelengths below the O K-edge to penetrate …
Authors
HITCHCOCK AP; MORIN C; TYLISZCZAK T; KOPRINAROV IN; IKEURA-SEKIGUCHI H; LAWRENCE JR; LEPPARD GG
Volume
9
Pagination
pp. 193-201
Publisher
World Scientific Publishing
Publication Date
February 2002
DOI
10.1142/s0218625x02001781
Conference proceedings
Surface Review and Letters
Issue
01
ISSN
0218-625X