Aberration-corrected STEM and EELS of semiconducting nanostructures Conferences

authors

• Kleiman, Rafael
• Cui, K
• Vajargah, S Hosseini
• Woo, SY
• Couillard, M
• Lazar, Sorin
• Kidman, RN
• Thompson, David Allan
• Botton, Gianluigi

status

• published 

publication date

• November 9, 2011

has subject area

• 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics (FoR)
• 0204 Condensed Matter Physics (FoR)
• 0299 Other Physical Sciences (FoR)

published in

• Journal of Physics: Conference Series  Journal

presented at event

• 17th International Conference on Microscopy of Semiconducting Materials  Conference

keywords

• LASERS
• MICROGRAPHS
• Microscopy
• Physical Sciences
• Physics
• Physics, Applied
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1088/1742-6596/326/1/012007

start page

• 012007

end page

• 012007

volume

• 326

issue

• 1