Conference
Test-Retest Reliability of the N400 Event-Related Brain Potential in Schizophrenia
Authors
Boyd JE; Patriciu I; Zipursky RB; Kiang M
Volume
75
Pagination
pp. 62S-62S
Publisher
ELSEVIER SCIENCE INC
Publication Date
May 1, 2014
Name of conference
69th Annual Scientific Convention and Meeting of the Society-of-Biological-Psychiatry
Conference place
New York, NY
Conference start date
2014
Conference proceedings
BIOLOGICAL PSYCHIATRY
Issue
9
ISSN
0006-3223