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An investigation into the temperature sensitivity...
Journal article

An investigation into the temperature sensitivity of strained and unstrained multiple quantum-well, long wavelength lasers: new insight and methods of characterization

Abstract

The magnitude of the temperature rate of change of the threshold current density (J/sub th/) is examined with respect to J/sub th/, for a variety of unstrained and strained, long wavelength multiple quantum-well (MQW) lasers. A strong correlation is found between these parameters, and a new relationship describing the J/sub th/-T relationship for these lasers is arrived at in terms of two new essentially temperature and length independent constants. A third constant, T/sub max/, also appears which estimates the theoretical maximum operating temperature of the laser. It is proposed that these constants may prove to be more useful in characterizing the temperature sensitivity of semiconductor lasers than the conventional parameters T/sub 0/ and I/sub 0/ which exhibit both a length and temperature dependence. Furthermore, an expression is found which relates the magnitude of T/sub max/ to adjustable device structural and material parameters, such as: the cavity length, L; facet reflectivity, R; transparency current density, J/sub tr/; and, the modal gain coefficient, /spl beta/. It is revealed that a close examination of this relationship may provide new insight into the physics of semiconductor lasers as well as a means for optimizing device design to obtain a high maximum operating temperature in order to eliminate the need for thermoelectric coolers in device packaging. Finally, the measured T/sub max/, versus L characteristics of six different strained and unstrained MQW laser structures are presented.<>

Authors

Evans JD; Simmons JG; Thompson DA; Puetz N; Makino T; Chik G

Journal

IEEE Journal of Selected Topics in Quantum Electronics, Vol. 1, No. 2, pp. 275–284

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

January 1, 1995

DOI

10.1109/2944.401206

ISSN

1077-260X

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