has subject area 0204 Condensed Matter Physics (FoR) 0601 Biochemistry and Cell Biology (FoR) 0912 Materials Engineering (FoR) Microscopy (Science Metrix)
keywords Damage EXTRACTION ION MICROANALYSIS Microscopy SCANNING-ELECTRON-MICROSCOPY SEM SPECIMENS STXM Science & Technology TEM TEM-EELS THERMAL-CONDUCTIVITY Technology ULTRAMICROTOMY X-RAY-ABSORPTION XANES focused ion beam soft materials