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High resolution mapping of surface reduction in...
Journal article

High resolution mapping of surface reduction in ceria nanoparticles

Abstract

Surface reduction of ceria nano octahedra with predominant {111} and {100} type surfaces is studied using a combination of aberration-corrected Transmission Electron Microscopy (TEM) and spatially resolved electron energy-loss spectroscopy (EELS) at high energy resolution and atomic spatial resolution. The valency of cerium ions at the surface of the nanoparticles is mapped using the fine structure of the Ce M(4,5) edge as a fingerprint. The …

Authors

Turner S; Lazar S; Freitag B; Egoavil R; Verbeeck J; Put S; Strauven Y; Van Tendeloo G

Journal

Nanoscale, Vol. 3, No. 8, pp. 3385–3390

Publisher

Royal Society of Chemistry (RSC)

Publication Date

2011

DOI

10.1039/c1nr10510h

ISSN

2040-3364