Conference
Optimal inspection intervals in a two-stage manufacturing process
Abstract
Authors
Vickson RG; Hassini E
Volume
1
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 1998
DOI
10.1109/icsmc.1998.725439
Name of conference
SMC'98 Conference Proceedings. 1998 IEEE International Conference on Systems, Man, and Cybernetics (Cat. No.98CH36218)
Conference proceedings
IEEE SMC'99 Conference Proceedings 1999 IEEE International Conference on Systems, Man, and Cybernetics (Cat No99CH37028)
ISSN
1062-922X