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Temporal noise analysis and measurements of CMOS...
Conference

Temporal noise analysis and measurements of CMOS active pixel sensor operating in time domain

Abstract

Image sensors in standard CMOS technology are increasing used for consumer, industrial and scientific applications due to their low cost, high level of integration and low power consumption. Further, image sensors in mainstream complementary metal-oxide-semiconductor (CMOS) technology are preferred because they are the lowest cost and easiest/fastest option to implement. For CMOS image sensors, a key issue is their noise behavior. Therefore, we …

Authors

de Souza Campos F; Ulson JAC; Swart JW; Deen MJ; Marinov O; Karam D

Pagination

pp. 1-5

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

DOI

10.1109/sbcci.2013.6644859

Name of conference

2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)