Advancing PIC Development Using Machine Learning: from Design to Fabrication to Optical Characterization Conferences uri icon

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authors

  • Xu, Dan-Xia
  • Grinberg, Yuri
  • Janz, Siegfried
  • Dedyulin, Sergey
  • Zhang, Jianhao
  • Vachon, Martin
  • Wang, Shurui
  • Weber, John
  • Cheben, Pavel
  • Schmid, Jens
  • Israel, Norman
  • Wang, Qiang
  • Ramunno, Lora
  • Gostimirovic, Dusan
  • Li, Andy
  • Liboiron-Ladouceur, Odile