Advancing PIC Development Using Machine Learning: from Design to Fabrication to Optical Characterization Conferences uri icon

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authors

  • Xu, DX
  • Grinberg, Y
  • Janz, S
  • Dedyulin, S
  • Zhang, J
  • Vachon, M
  • Wang, S
  • Weber, J
  • Cheben, Pavel
  • Schmid, J
  • Israel, N
  • Wang, Q
  • Ramunno, L
  • Gostimirovic, D
  • Li, A
  • Liboiron-Ladouceur, O

publication date

  • January 1, 2025