EELS at Extreme Energy Losses (XEELSTM); an Opportunity to Obtain X-ray Absorption Spectroscopy-like Information Using an Electron Microscope Conferences uri icon

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authors

  • Lazar, Sorin
  • Tiemeijer, Peter
  • Schnohr, Claudia
  • Meledina, Maria
  • Hoeche, Thomas
  • Longo, Paolo
  • Freitag, Bert