Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints

We introduce here a new family of divergence-based estimators in this work for predicting the lifetimes of one-shot devices subjected to cyclic Accelerated Life-Tests (ALTs). This family, which includes the maximum likelihood estimator (MLE) as a special case, offers a robust alternative to traditional inferential procedures. We also present a family of divergence-based model selection criteria. A simulation study and a numerical example illustrate the advantages of these estimators and the robust inferential methods based on them.