Anomaly Detection in Dynamic Power Events Using Data Fusion for Chip Design

This paper describes a methodology to detect anomalies in estimated dynamic power series reported by elec-tronic design automation (EDA) tools during very-large-scale integration (VLSI) semiconductor chip design. EDA software is commonly used to predict the expected behaviour of a chip prior to its manufacturing. However, the extremely complex nature of modern chip design and various simulation environment circum-stances may lead to false …