Conference
Extracting Sensitivities from Full-Wave Electromagnetic Solutions
Abstract
Authors
Bakr MH
Pagination
pp. 99-112
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2005
DOI
10.23919/emc.2005.10806373
Name of conference
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility