Conference
RAD: A Comprehensive Dataset for Benchmarking the Robustness of Image Anomaly Detection
Abstract
Authors
Cheng Y; Cao Y; Chen R; Shen W
Volume
00
Pagination
pp. 2123-2128
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2024
DOI
10.1109/case59546.2024.10711763
Name of conference
2024 IEEE 20th International Conference on Automation Science and Engineering (CASE)