Conference
Data-Driven Inter Turn Short Circuit Fault Detection of a Segmented SRM Based on Multi-Path Convolutional Neural Network and fCWT
Abstract
Authors
Mohammad-alikhani A; Mahmouditabar F; Baker NJ; Nahid-Mobarakeh B
Volume
00
Pagination
pp. 1-6
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 4, 2024
DOI
10.1109/icem60801.2024.10700419
Name of conference
2024 International Conference on Electrical Machines (ICEM)