Conference
Development of A Multi-Layer Silicon Betaray Spectrometer for CANDU Environment and Preliminary Characterization
Abstract
Authors
Cheng X; Dyer B; Hanu A; Byun SH
Volume
00
Pagination
pp. 1-1
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 2, 2024
DOI
10.1109/nss/mic/rtsd57108.2024.10658270
Name of conference
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)