Conference
Morphological Operator and Rough Set Theory for Fault Line Detection
Abstract
Authors
Yun-zhu A; Xi-shan W; Xun L; Ying X; Ying-kai L
Volume
1
Pagination
pp. 1-4
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2011
DOI
10.1109/appeec.2011.5748966
Name of conference
2011 Asia-Pacific Power and Energy Engineering Conference