Conference
Wavelet Based fMRI Analysis for Autism Spectrum Disorder Detection using Feature Selection and Ridge Classifier
Abstract
Authors
Ladani FG; Karimi N; Khadivi P; Samavi S
Volume
00
Pagination
pp. 165-171
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 31, 2024
DOI
10.1109/aiiot61789.2024.10578987
Name of conference
2024 IEEE World AI IoT Congress (AIIoT)