XPS and EELS Characterization of Mn2SiO4, MnSiO3 and MnAl2O4

X-ray Photoelectron Spectroscopy (XPS) and Electron Energy Loss Spectroscopy (EELS) are strong candidate techniques for characterizing the steel surface and the substrate-coating interface, respectively. However, unambiguous identification of ternary oxides such as Mn2SiO4, MnSiO3, and MnAl2O4 by XPS or EELS is difficult due to the lack of fully characterised standards in the literature. To resolve this issue, samples of Mn2SiO4, MnSiO3 and MnAl2O4 were synthesized and characterized by XPS and EELS. The present contribution outlines the unique features of the XPS and EELS spectra derived from the Mn2SiO4, MnSiO3 and MnAl2O4 standards, thereby allowing users to identify specific oxides at the surface and subsurface of Mn, Si and Al alloyed steels using these techniques.