Conference
Development of A Multi-layer Silicon Beta-ray Dosemeter for CANDU Environment
Abstract
Authors
Cheng X; Dyer B; Hanu A; Byun SH
Volume
00
Pagination
pp. 1-4
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 12, 2022
DOI
10.1109/nss/mic44845.2022.10399266
Name of conference
2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)