Conference
Will my Flight be on Time? Learning from Part Failures to Predict Future Reliability
Abstract
Authors
Park J; Chiang F; Da Silva EC; Lytwyn K; Veldhuis S
Volume
00
Pagination
pp. 1803-1813
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 18, 2023
DOI
10.1109/bigdata59044.2023.10386304
Name of conference
2023 IEEE International Conference on Big Data (BigData)