authors
- Perez-Pinal, Francisco
- Gasca-Figueroa, D
- García-Rodríguez, FJ
- Castro-Beltrán, R
- Pérez-Pinal, FJ
- Vélez-García, RD
- Gutiérrez-Juárez, G
A piecewise thickness-function to the interferometric measurement of the optically transparent thin films
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Overview
status
publication date
- February 2024
has subject area
- 0205 Optical Physics (FoR)
- 0906 Electrical and Electronic Engineering (FoR)
- Optoelectronics & Photonics (Science Metrix)
published in
- Optical and Quantum Electronics Journal