Conference
An Improved Bound for Optimal Locally Repairable Codes
Abstract
Authors
Cai H; Fan C; Miao Y; Schwartz M; Tang X
Volume
00
Pagination
pp. 3379-3384
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 20, 2021
DOI
10.1109/isit45174.2021.9518040
Name of conference
2021 IEEE International Symposium on Information Theory (ISIT)