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Loss Modeling and Testing of 800-V DC Bus IGBT and...
Journal article

Loss Modeling and Testing of 800-V DC Bus IGBT and SiC Traction Inverter Modules

Abstract

This article investigates efficiency gains achieved using an 800-V dc bus and wide bandgap silicon carbide (SiC) semiconductors for a light-duty electric vehicle (EV), rather than an insulated-gate bipolar transistor (IGBT) inverter with a 400-V bus as is commonly used for EVs. Analytical inverter loss models with 600- and 1200-V IGBTs, and 1200-V hybrid SiC and 1200-V All-SiC semiconductors are incorporated into a Chevrolet Bolt EV model and …

Authors

Allca-Pekarovic A; Kollmeyer PJ; Reimers J; Mahvelatishamsabadi P; Mirfakhrai T; Naghshtabrizi P; Emadi A

Journal

IEEE Transactions on Transportation Electrification, Vol. 10, No. 2, pp. 2923–2935

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

June 1, 2024

DOI

10.1109/tte.2023.3300669

ISSN

2577-4212