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CHARACTERIZATION OF WET CHEMICAL ETCHING OF ALGAAS...
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CHARACTERIZATION OF WET CHEMICAL ETCHING OF ALGAAS LAYERS USING DYNAMIC OPTICAL REFLECTIVITY

Authors

ARMSTRONG JV; FARRELL T; TURNER G

Editors

Abernathy CR; Bates CW; Bohling DA; Hobson WS

Series

MATERIALS RESEARCH SOCIETY CONFERENCE PROCEEDINGS

Volume

282

Pagination

pp. 139-143

Publisher

MATERIALS RESEARCH SOC

Publication Date

January 1, 1993

ISBN-10

1-55899-177-8

Name of conference

3RD BIENNIAL MEETING OF CHEMICAL PERSPECTIVES OF MICROELECTRONIC MATERIALS, AT THE 1992 FALL MEETING OF THE MATERIALS RESEARCH SOC

Conference place

MA, BOSTON

Conference start date

November 30, 1992

Conference end date

December 3, 1992

Conference proceedings

CHEMICAL PERSPECTIVES OF MICROELECTRONIC MATERIALS III

ISSN

0886-7860

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