In-situ laser reflectometry of the epitaxial growth of thin semiconductor films Conferences

authors

• Farrell, Thomas
• Armstrong, John V

status

• published 

publication date

• February 1995

has subject area

• Applied Physics (Science Metrix)

published in

• Applied Surface Science  Journal

presented at event

• Symposium B on Photon-Assisted Processing of Surfaces and Thin Films, at the 1994 E-MRS Spring Conference  Conference

keywords

• ALXGA1-XAS
• ANISOTROPY
• CBE GROWTH
• Chemistry
• Chemistry, Physical
• DYNAMIC OPTICAL REFLECTIVITY
• GAAS
• MOLECULAR-BEAM EPITAXY
• Materials Science
• Materials Science, Coatings & Films
• Physical Sciences
• Physics
• Physics, Applied
• Physics, Condensed Matter
• SPECTROSCOPY
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1016/0169-4332(94)00388-2

start page

• 582

end page

• 590

volume

• 86

issue

• 1-4