Conference
Microphotoluminescence mapping of packaging-induced stress distribution in high-power AlGaAs laser diodes
Authors
Martin P; Landesman J-P; Martin E; Fily A; Hirtz J-P; Bisaro R
Volume
3945
Pagination
pp. 308-316
Publisher
SPIE, the international society for optics and photonics
Publication Date
March 29, 2000
DOI
10.1117/12.380548
Name of conference
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X