Preprint
Photonic Temperature and Wavelength Metrology by Spectral Pattern Recognition
Abstract
Spectral pattern recognition is used to measure temperature and generate
calibrated wavelength/frequency combs using a single silicon waveguide ring
Authors
Janz S; Cheriton R; Xu D-X; Densmore A; Dedyulin S; Todd A; Schmid J; Cheben P; Vachon M; Dezfouli MK
Publication date
April 18, 2020
DOI
10.48550/arxiv.2004.08696
Preprint server
arXiv