Conference
An Examination of the Relationships between Leadership Style, Quality, and Employee Satisfaction in R&D Environments
Abstract
Authors
Berson Y; Linton J
Pagination
pp. 410-414
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2003
DOI
10.1109/iemc.2003.1252304
Name of conference
IEMC '03 Proceedings. Managing Technologically Driven Organizations: The Human Side of Innovation and Change